Nikon Microscope LV150NA

1.Product Overview

The Nikon LV150NA is a high-performance upright industrial microscope renowned for its precision and versatility. Designed for materials analysis, semiconductor inspection, and industrial quality control, this second-hand unit offers advanced optical capabilities at a fraction of the cost of new equipment. Despite previous use, it maintains excellent functionality and reliability, making it an ideal choice for laboratories, research institutions, and manufacturing facilities seeking cost-effective microscopy solutions.

2.Core Advantages

2.1  High-Resolution Imaging

Equipped with Nikon's CFI60-2 infinity-corrected optical system and high numerical aperture (NA) objectives (5X/0.15, 10X/0.3, 20X/0.45, 50X/0.95, 100X/0.9), the LV150NA achieves precise magnification ranging from 50X to 1000X, delivering sub-micron resolution. Whether examining nanoscale circuits on semiconductor chips or the microstructure of metal grains, it provides sharp, detailed images essential for accurate analysis.

2.2 Multi-Mode Observation Capabilities

The microscope supports various observation modes, including Brightfield, Darkfield, Differential Interference Contrast (DIC), Polarization, and Fluorescence. In DIC mode, subtle height differences on sample surfaces are converted into vivid 3D-like contrast, enabling detection of fine textures on mold surfaces or soldering defects on PCBs. The Polarization mode is ideal for studying the optical properties of anisotropic materials such as minerals and liquid crystals, enhancing versatility across different applications.

2.3 Modular Design

Featuring a modular architecture, the LV150NA allows seamless integration of accessories like digital cameras, image analysis software, and motorized stages. Users can attach Nikon’s DS-Fi3 camera for high-definition imaging or pair it with NIS-Elements software for automated measurement and data analysis. This flexibility ensures the microscope adapts to evolving research or inspection requirements.

3 Technical Specifications

4 Application Fields

Semiconductor Industry: Inspecting IC wafer surface defects, observing photoresist patterns, analyzing wafer bonding interfaces.

Materials Science: Examining microstructures of metals/alloys, analyzing ceramic material fractures, measuring coating thicknesses.

Electronics Manufacturing: Assessing PCB soldering quality, detecting component packaging defects, inspecting FPC flexible circuit boards.

Research & Education: Conducting material microstructure research in university labs and providing microscopy training in vocational institutions.