Olympus USPM - RUZ Reflectance Measuring Machine Integrated with Microscope Functionality

Product Details

The Olympus USPM - RUZ is a cutting - edge instrument that combines the functionality of a microscope with advanced reflectance measurement capabilities.

1. Micro - area Reflectance Measurement

It is equipped with high - quality objectives that can focus on extremely small areas, enabling the measurement of reflectance at points as small as Φ17 - 70μm. This makes it ideal for applications such as analyzing optical elements, where minute surface details can significantly affect optical performance, and for inspecting tiny electronic components, where accurate reflectance data can provide insights into material quality and manufacturing defects.

2. Spectral Analysis

The USPM - RUZ is capable of performing spectral analysis across a broad wavelength range, typically from the visible light to the near - infrared region (similar to the USPM - RU - W which has a range of 380nm - 1050nm). By measuring the reflectance at different wavelengths, it can provide detailed information about the material composition and properties of the sample. For example, in material science, this spectral data can help identify the presence of specific chemical bonds or crystal structures.

3. Additional Optical Parameter Measurements

Film Thickness Measurement: Leveraging the measured reflectance data, the USPM - RUZ can accurately determine the thickness of single - layer and multi - layer films in the range of approximately 50nm - 10μm. Different film thickness analysis methods are employed, such as calculating film thickness based on the periodicity of spectrophotometric reflectance values. This feature is extremely useful in the production of optical coatings and semiconductor wafers.

Object Color Measurement: Based on the reflectance data, the instrument can display color - related information in the form of XY chromaticity diagrams and Lab* chromaticity diagrams along with relevant numerical values. This is beneficial in industries where color accuracy is crucial, such as in the manufacturing of display panels or in the cosmetics industry for quality control of product color.

Transmittance Measurement: For planar samples, the USPM - RUZ can measure transmittance. A Φ2mm parallel light is transmitted from the bottom of the sample stage, allowing for the accurate determination of the amount of light passing through the sample. This is valuable for characterizing optical components like transparent lenses or filters.

45 - degree Incidence Reflectance Measurement: By directing a Φ2mm parallel light at a 45 - degree angle to the sample surface, the instrument can measure the reflectance at this specific incidence angle. This is particularly useful for analyzing components such as prisms and mirrors, where the reflectance at 45 - degree incidence is a critical parameter.

4. Microscope - like Observation Function

Similar to the USPM - RUⅢ series, the USPM - RUZ may be equipped with an eyepiece that allows for visual observation of the sample's surface. This visual inspection, combined with the reflectance and other optical parameter measurements, provides a more comprehensive understanding of the sample. It helps the operator to precisely locate the area of interest for measurement and also to visually assess the overall condition of the sample surface, such as the presence of scratches or contaminants that may affect the measurement results.