TPXRD- 1000 Short Wavelength X-ray Diffractometer

TPXRD- 1000 Short Wavelength X-ray Diffractometer

Description:

Crystallography plays a cornerstone role in the 20th century science and technology. It also promotes the birth and development of crystal diffraction analysis techniques and instruments such as X-ray diffraction, and promotes the development of solid science and technology.It is also widely used in basic research and materials. Engineering, surface engineering, chemical engineering, mechanical engineering and other fields.

The existing X-ray diffractometer can only be used to detect and analyze the crystal structure and variation of the deep matter of about 10 micrometers on the surface of the workpiece or sample. The invention of the neutron diffractometer solves the scientific and technical problems of non-destructive testing of the crystal structure of the workpiece or the internal material of the sample and its changes (such as internal stress, internal phase, internal texture, etc.). However, neutron diffractometers require a nuclear reactor that produces high-flux neutrons as a source of neutrons, making the instrument and its technology difficult to promote in general countries and enterprises.

We have been making great efforts for many years, taking advantage of the strong penetration of short-wavelength X-rays, based on the principle of "wave-particle duality" of light, relying on innovative optical path design, unique X-ray monochromation technology, advanced mechanical and electronic control. The technology and the new analytical calculation software solve the engineering problems of non-destructive testing and analysis of the crystal structure of the workpiece or the internal material of the sample and its changes (such as internal stress, internal phase, internal texture, etc.). The TPXRD-1000 short-wavelength X-ray diffractometer we have created provides a non-destructive solution for analyzing the internal stress, internal phase, internal texture and distribution of workpieces or samples.

Feature:

▇ Light alloy and its processing

▇ Structural strength of metal components

▇ Rolled steel sheet

▇ Ceramic materials and their processing

▇ Silicon material and its processing

▇ Archaeology and cultural relics identification

▇ Power plant

▇ And, determined by crystallographic diffraction analysis of the internal material, without destroying the sample or the workpiece.

▇ Non-destructive measurement of residual stress and distribution of rolled light alloy sheets can be used for optimization of rolling process and heat treatment process;

▇ Non-destructive testing of the phase, texture and stress of the composite coating involves crystal structure and its changes, which can be used to optimize the coating process;

▇ Non-destructive testing of the internal stress and distribution of the single crystal silicon body can be used for the monocrystalline silicon heat treatment process and the optimization of the single crystal silicon wafer processing process;

▇ Non-destructive testing of the internal phase of cultural relics can be used for the identification of archaeology and cultural relics;