AFM contact mode afm atomic force microscopy

 Atomic Force Microscopy (AFM), an analytical instrument that can be used to study the surface texture of solid materials, including insulators.It examines the surface structure and properties of a substance by detecting a very weak interatomic force between the surface of the sample to be measured and a micro-force-sensitive element.When the sample is scanned, these changes can be detected by the sensor to obtain the force distribution information, so as to obtain the surface topography structure information and the surface roughness information at the nanoscale resolution.

1.       Integrated scanning probe and sample stagenhanced the anti-interference ability.

2  Precision laser and probe positioning device make changing the probe andadjusting the spot simple and convenient.

3. By using the sample probe approaching manner,the needle could perpendicular to thesample scanning.       

4.   Automaticpulse motor drive control sample probe vertical approaching, to achieve precisepositioning of the scanning area.

5.   Samplescanning area of interest could freely moved by using the design of highprecision sample mobile device.

6.   CCDobservation system with optical positioning achieves real-time observation andpositioning of the probe sample scan area.

7.   Thedesign of electronic control system of modularization facilitated maintenanceand continuous improvement of circuit.

8.   Theintegration of multiple scanning mode control circuit, cooperate with softwaresystem.

9.    Spring suspension which simple and practicalenhanced anti-interference ability.

Work mode: FM-Tapping, optional contact, friction, phase,magnetic or electrostatic

2,Size:Φ≤90mm,H≤20mm

3,Scanningrange:20 mmin XYdirection,2 mm in Z direction.

4,Scanningresolution:0.2nm in XY direction,0.05nm in Z direction.

5,Movementrange of sample:±6.5mm.

6,Pulse width ofthe motor approaches:10±2ms.

7,Image sampling point:256×256,512×512.

8,  optical magnification 4X,opticalresolution 2.5 mm.

9,Scanrate 0.6Hz~4.34Hz,scanangle 0°~360°.

10,Scanningcontrol : 18-bit D/A in XY direction,16-bit D/A in Z direction.

11,Datasampling:14-bitA/D,double16-bit A/D multi-channel synchronous sampling.

12,Feedback:DSP digital feedback.

13,Feedbacksampling rate:64.0KHz.

14,Computerinterface:USB2.0.

15,Operatingenvironment:Windows98/2000/XP/7/8.

Friendly software interface and operating functions

1.Can be real-time observation of the sample scan surface morphology, amplitude and phase image;

2.With contact, tapping, phase, friction, magnetic or electrostatic force mode;

3.The image sampling point can be freely selected as 256 × 256 or 512 × 512;

4.Multi-channel image synchronization acquisition display, real-time view profile;

5.Multi-channel image synchronization acquisition display, real-time view profile.

6.Various Curve Force-Spacing (F-Z), frequency-RMS (f-RMS), RMS-gap (RMS-Z) measurement functions.

7.Scanning area excursion, shear function, arbitrary selection of the sample area of interest.

8.Can be arbitrarily selected sample starting scanning angle

9.Real - time Adjustment Function of Laser Spot Detecting System

10.Pinpoint formant Auto/manual search function.

11.You can arbitrarily define the swatch function of scanned images

12.Support sample tilt line average, offset real-time correction function

13.Supports scanner sensitivity correction and automatic correction of the electronics controller

14.Support sample picture off-line analysis and processing functions

Application field

 Package : Wooden case package 

Shipping : 5~7days