FM-Nanoview LS-AFM Industrial Atomic Force Microscope

Features

1. The first domestic AFM to realize that the sample remains stationary and the probe moves to scan;

2. The first company in China to use closed-loop three-axis independent piezoelectric translating scanner to scan a wide range of high precision;

3. The size and weight of the sample are basically unlimited, especially suitable for the detection of large samples such as integrated circuit wafers;

4. Gantry scanning head design, marble base, vacuum adsorption stage;

5. Over-travel 2-D electric sample mobile station to quickly select the sample area of ​​interest;

6. High-power optical positioning system to achieve precise positioning of the probe and sample scanning area;

7. Simple laser spot adjustment method, which can observe and adjust light spot in real time through optical CCD window;

8. The single-axis drive scanning head automatically approaches the sample vertically, accurately positions the scanning area, and the needle tip is perpendicular to the sample scanning;

9. Motor control pressure electric ceramic automatic detection intelligent needle, protect the probe and sample;

10. Equipped with a closed metal shield, pneumatic shock-absorbing platform, strong anti-interference ability, does not affect the operation of the instrument;

11. Integrated Scanner Hardware Non-linear calibration user editor, Nano characterization and measurement accuracy better than 98%.

Technical Parameters  

Basic operating modes: contact, tap, F-Z force curve measurement, RMS-Z curve measurement, friction/lateral force, amplitude/phase, magnetic force and electrostatic force

Optional Work Mode: Profile Line Fast Measurement Mode

The largest sample size: Φ ≥ 300mm, H ≥ 50mm

Closed-loop scanning range: XY to 100um, Z to 10um

Closed-loop scanning resolution: XY to 0.2nm, Z to 0.05nm

Sample movement range: 300mm×300mm

Auxiliary optical positioning: 10X objective lens, optical resolution 1um (optional 20X, optical resolution 0.8um)

Pneumatic shock absorbing table, damping frequency 0.5Hz

Noise level: <0.1nm

Scan rate 0.6Hz~4.34Hz, scan angle 0~360°

Scan Control: XY uses 18-bit D/A, Z uses 16-bit D/A

Data sampling: 14-bit A/D, dual 16-bit A/D multiplex simultaneous sampling

Feedback method: DSP digital feedback

Feedback sampling rate: 64.0KHz

Communication interface: USB2.0/3.0

Operating environment: WindowsXP/7/8/10 operating system

Dear Customer, 

We,Xi’an Yima Opto-electrical Technology Com.,Ltd. is an integrated economic entity of R&D,manufacturing and trading with over 20 years of history. 

Our business scope covers various fields such as biochemical analysis,environmental protection,industrial testing,bioscience,medical apparatus and instruments,internet technology and some frontier science. 

Through a long-time development,we own a national resources system of various professional talents,abundant supply for various components & parts and special materials,full producing &processing equipments,strong Technological standardization and a complete quality assurance system. 

If you need OEM or ODM in manufacturing,scientific research,market development and or you want to build your own brand in your country,it’s our honor to cooperate with you.In this way,we have developed many products for our customers from the USA,Europe and South Africa and got good feedback on Alibaba. 

We firmly believe that science and technology is no boundaries. 

Our mission is to make every effort to contribute to all humanity.

 Your earlier friendly enquire from us would be highly appreciated.Thanks in advance!