LTE XOR Algorithm Test (U)SIM Card - Mini-UICC

LTE MILENAGE Test (U)SIM Card - Mini-UICC

LTE USIM Card Support CDMA ,GSM ,WCDMA ,TD_SCDMA Network all data .

LTE USIM Card can write " PIN,PUK ,ADM , IMSI ,ICCID ,SMSC, OPC ,KI " into card .

compliant to 3GPP standard , Can operate at a max  temperature  75c , minimum temperature of -40c .

• UICC multi-application platform
• New LTE data fields implemented
• Three applications: Test SIM, Test USIM, Test ISIM
• 1.8V / 3V / 5V
• 128K EEPROM
• APIN 1 disabled
• GSM XOR/3G test algorithm
• Creation of new data fields allowed

LTE 4G Series is designed to meet the current market demands rapid development of the fourth generation of mobile communication, according to domestic and foreign carriers to promote the use of 4G networks, independent research and development of new smart card products for TD-LTE and FDD LTE and other network. In terms of compatibility, it applies not only to the 4G network, but also backward compatible with 3G, 2G network, can successfully adapt to the transition from the era of 3G to 4G market era.

LTE USIM NATIVE and JAVA including two series, capacity from 64k to 256k covering all product types to meet various needs of domestic and international markets.

Packing and Shipping 

1. 200pcs /box ,  2000pcs ,3000pcs ,5000pcs /carton ,  carton is paper carton 

2. Shipping :  By express, by air or  sea

3. Weight :7Kg /1000pcs 

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