IEC61032/IEC60529 Degrees of protection IP10-IP40 against access to hazardous parts test probe

The test probe kits is designed to provide the probes required by IEC61032 and IEC60529  the IP Code standard. It includes the following products: 

· Test Sphere Probe with handle with 50N thrust 

· Jointed Finger Probe with 50N thrust 

· 2.5 mm Test Rod with 3N thrust 

· 1.0 mm Test Wire with 1N thrust

· Aluminum suitcases

IP1X Probe A Technical Parameters:

1, Ball Diameter: 50mm

2, Baffle Plate Diameter: 45mm

3, Baffle Plate Thickness:4mm

4, Handle Diameter: 10mm

5, Handle Length :100mm

6, Force: 50N

IP2X Test Finger Probe Technical Parameters:

1, Knurled Finger Diameter:12mm

2, Knurled Finger Length :80mm

3, Baffle Plate Diameter :50mm

4, Baffle Plate Length : 100mm

5, Force: 50N

IP3X Test Probe C technical parameters

1,  Test Probe Length :100mm

2,  Test Probe Diameter:2.5mm

3,  Dam- sphere Diameter:35mm

4,  Handle Diameter:10mm

5,  Handle Length 100mm

6, Force: 3N

IP4X Test Probe D Technical parameters

1, Test Probe Length :100mm

2, Test Probe Diameter:1.0mm

3,Dam- sphere Diameter:35mm

4,Handle Diameter:10mm

5,Handle Length 100mm

6, Force: 1N

Sherry Xu

Tel:+86-0755-21518810

Email:sherryxu@jusdatest.com