simiconductor tester

packed by plastic foam liner first, then packed into export carton

Introduction

The STZ-3 semiconductor electric conduction model detector is for distinguishes the silicon unit crystal material the conduction type “P” and “N” the metering equipment.Uses the temperature difference effect and the valve effect two methods unifies the comprehensive survey electric conduction model instrument, the measuring range broad silicon material electronic resistivity from 10^-2~10⁴Ω/cm.

The instrument used the US 16 monolithic integrated circuit computer is the core, the use digit gathering filter technique, and uses “P” “N” the numerical code to display directly. Using SCM technology enables the measurement accuracy and stability greatly. Four-probe instrument using hand-held probe natural, simple, easy to operate and long life, suitable for semiconductor materials factory, the device works and scientific research departments.

use the rectification method to sort Solar polycrystalline materials, if resistivity <0.01Ω/cm , the tested material can be indicated as the “readulterated material” by means of sound and light alarm. Widely used in solar cell production of raw material selection links, quickly and efficiently.

Technical parameters

1)        measuring range: 10^-2~10⁴Ω/cm.

2)        measurable material: silicon rods and wafers, and silicon broken particles

3)        semiconductor materials can be measured dimensions: Φ15 ~ Φ150 mm or more

4)        display way: P and N

5)        test probe: hand holder, probe space: 3mm, probe material: High-speed needleΦ1mm( if you need we also can change this into tungsten carbideφ0 )

6)        electric supply: 220V, 50Hz, 20W